Instrument Lab / 荧光仪器可视化实验室
荧光仪器教学骨架
Explore a static 3D optical bench, grating-driven monochromators, and a simplified synthetic trace.
从激发单色器、样品池、90° 发射收集到检测输出，用一个克制的教学骨架理解荧光分光光度计的工作链路。
Conceptual model only. Not real instrument control. Not calibrated measurement.
仅为概念模型，不是真实仪器控制，也不是校准测量。
1. Choose a mode / 选择模式 Pick a scan channel. 选择扫描模式，先看哪一路通道在变化。
2. Move one control / 移动控制项 Watch the trace respond. 移动一个控制项，观察合成谱线如何响应。
3. Inspect a mono / 查看单色器 Click Ex or Em mono, then drag the grating. 点选激发或发射单色器，然后拖动光栅。
Primary path: click Ex mono or Em mono, drag the pale grating face or glowing handle, then watch the split rays, wavelength, beam color, diagnostics, and synthetic spectrum update.
主要路径：点击激发或发射单色器，拖动浅色光栅面或发光手柄，再观察分光线束、波长、光束颜色、诊断和合成谱图同步变化。
Blue excitation axis / 蓝色激发轴 Light reaches the sample through the excitation monochromator; the straight-through residual excitation is shown entering a beam stop, not the detector. 光经激发单色器到达样品；直通方向的剩余激发光进入光束终止器，而不是进入检测器。
Cyan 90° collection arm / 青色 90° 收集臂 Fluorescence is collected from the side path through the emission monochromator before detection. 荧光从侧向路径被收集，经过发射单色器后再进入检测器。
Beam stop / 光束终止器 The straight-through excitation direction enters an absorbing stop, so it is not read as reflected light or detector collection. 直通方向的激发光进入吸收终止块，避免被误解为反射光或检测光路。
Signal output line / 信号输出线 The fine line after the detector represents a processed display signal, not another optical beam. 检测器之后的细线表示处理后的显示信号，不是另一束光。
Controls / 控制面板
Select source in the 3D scene, then drag the blue Z-axis handle for a bounded entrance offset. The sample cell stays fixed in the holder; select detector to reveal the cyan arm handle. These geometry changes affect intensity and diagnostics, not selected wavelength.
在 3D 场景中选择光源，可拖动蓝色 Z 轴手柄做受限入口偏移；样品池固定在样品架中。选择检测器可显示青色检测臂手柄。这些几何变化只影响强度和诊断，不改变选通波长。
Sample cell is fixed in this model, matching the usual cuvette-holder workflow. 样品池在此模型中固定，贴近常见比色皿架的使用方式。
Emission scan: fixed excitation wavelength, scanning emission wavelength. / 发射扫描：固定激发波长，扫描发射波长。
Scan axis / 扫描轴 Emission 200-900 nm / 发射 200-900 nm
Fixed channel / 固定通道 Excitation 365 nm / 激发 365 nm
Throughput / 通光量 0%
Overlap / collection / 重叠 / 收集 100% / 100%
Part note / 部件说明
Provides broadband or selected excitation energy before the path is shaped by the excitation monochromator. 光源提供宽带或选定的激发能量，随后由激发单色器塑造光路。
Select source in the 3D view, then drag the blue Z-axis handle or use Source offset. Alignment changes intensity, not wavelength. 在 3D 视图中选择光源后，可拖动蓝色 Z 轴手柄或使用光源偏移；对准只改变强度，不改变波长。
Diagnostics / 物理状态
Synthetic output / 合成输出
Peak / 峰值 0.00 a.u.
Illustrative synthetic traces only. Shapes and intensities do not represent calibrated spectra, real samples, or instrument validation.
仅为示意性合成谱线；形状和强度不代表校准谱图、真实样品或仪器验证。
Source-derived examples / 引用数据示例
These examples are loaded from a local manifest and processed JSON package. They are separate from the synthetic controls above.
这些示例来自本地 manifest 与处理后的 JSON 数据包，和上方的合成控制项彼此独立。
Loading local source data package. / 正在加载本地数据包。
EEM slice explorer / EEM 切片查看
This only reads cross-sections from the processed EEM. It does not control the synthetic instrument model.
这里仅查看处理后 EEM 的横向或纵向切片，不控制上方合成仪器模型。
Source-derived examples are display-processed and should not be compared as calibrated intensities. 这些引用示例已为显示处理，不能作为校准强度进行比较。
Displayed source-derived data are normalized/downsampled for educational visualization. They are not measurements from this website and not calibrated by this site.
页面展示的引用数据已为教学可视化归一化或降采样；它们不是本站测量结果，也未由本站校准。
Calibration references are tracked separately and are not plotted unless an exact public data file and reuse boundary are verified.
校准参考资料单独记录；只有在确认具体公开数据文件和复用边界后才会绘制。
Corrections & artifacts / 校正与伪影
These cards turn trusted instrument guidance into visitor-facing caveats. They are teaching notes, not corrections applied by this website.
这些卡片把可信仪器资料转成访客可读的注意事项；它们是教学说明，不代表本站已执行校正。
Detector responsivity and optical throughput vary with wavelength, so uncorrected shapes should be read cautiously. / 检测器响应与光学通量会随波长变化，未校正谱形只能谨慎解读。
An excitation scan is not just a material response unless source intensity is accounted for. / 激发扫描若未考虑光源强度变化，就不能只当作材料本身响应。
The simulator shows this qualitatively; it does not reproduce a certified instrument function. / 模型只定性展示信号与分辨率的取舍，不复现认证仪器函数。
They are optical artifacts or solvent-related signals, not automatically sample fluorescence peaks. / 它们可能是光学伪影或溶剂相关信号，并不自动等同于样品荧光峰。
Absorption and reabsorption can change intensity and apparent shape before any material conclusion. / 吸收与再吸收会先改变强度和表观谱形，不能直接推出材料结论。
Detector linear range matters for quantitative work; this page avoids quantitative comparison. / 定量工作需要考虑检测器线性范围；本站避免做定量比较。
Reference context / 参考背景： NIST correction standards and USGS fluorescence field guidance. No NIST or USGS data are plotted here. / 本页未绘制 NIST 或 USGS 数据。
Sample & geometry boundaries / 样品与几何边界
The current bench teaches a common right-angle fluorescence geometry. Real samples may require different geometry, dilution, or correction strategy.
当前光学台用于讲解常见的直角荧光采集；真实样品可能需要不同几何、稀释或校正策略。
Excitation passes through the sample, while fluorescence is collected from the side to reduce direct excitation light. / 激发光穿过样品，荧光从侧向采集，以减少直射激发光干扰。
This is noted as a boundary only; the current 3D simulator does not implement front-face optics. / 这里只作为边界提示；当前 3D 模型未实现前表面光路。
Material interpretation needs sample context; this page only shows cautious examples. / 材料解释需要样品背景；本页只展示谨慎的教学示例。
USGS DOM or EVOO EEM subsets are candidates only after provenance review. / USGS DOM 或 EVOO EEM 子集只有经过来源审查后才适合加入。